Discovery Brief: Thermo-mechanical stresses caused by CTE-mismatch is considered detrimental to the reliability of electronic packages. Units were cycled from -55 deg C to +125 deg C ten (10) times over 5 hours.
Temperature Cycle Test - Anime Snapshot
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Thermo-mechanical stresses caused by CTE-mismatch is considered detrimental to the reliability of electronic packages. Units were cycled from -55 deg C to +125 deg C ten (10) times over 5 hours.
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- Thermo-mechanical stresses caused by CTE-mismatch is considered detrimental to the reliability of electronic packages.
- Units were cycled from -55 deg C to +125 deg C ten (10) times over 5 hours.
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